Silicon Photonics Integrated Circuits: Experimental characterization of passive components

In the frame of the Interdepartmental Center Photonext, we have developed an experimental set-up for the testing of passive silicon photonics integrated circuits. We can:
- characterize silicon, silicon/poly-si and silicon nitride micro-rings in both linear and non-linear regimes
- perform pump-probe experiments to measure the free carrier lifetimes in silicon and silicon/poly-Si waveguides and micro-rings
- test other passive components such as waveguides, gratings, MZI etc…
It is under-development the control of the components mentioned above via thermal tuning and the testing of hybrid III-V/Si external cavity lasers (measurements of LI, optical spectra with high-resolution optical spectrum analyser, analysis of the tolerance to the external optical feedback)

Link:

Erc Sector:

  • PE7_5 (Micro and nano) electronic, optoelectronic and photonic components
  • PE7_6 Communication technology, high-frequency technology

Keywords:

  • Photonic integrated circuits
  • Silicon micro-ring resonators
  • Testing and characterization