Chip level EMC measurements
This research line deals with the EMC characterization of Integrated Circuits (ICs), including System on Chips (SoCs) and Smart Power Devices, as well as high density power modules. The EMC performance of electric/ electronic modules depends on that of the devices they are made of. Over the years, besides improving the methods prescribed in International standards like IEC 61967, IECac 62132, and SAE 1752/3, we proposed new solutions such as that based on the use of multi-tone interference in direct power injection (DPI) tests. The activity is mostly carried out at the Microelectronics EMC Laboratory.
- PE2_17 Metrology and measurement
- Integrated circuit measurements
Gruppi di ricerca
Persone di riferimento
- FIORI FRANCO - Responsabile