Noise metrology

This activity is dedicated to the development of traceable noise measuring systems for the noise characterization of devices and materials, in particular for in the low-frequency regime.

This activity also includes the design of low-noise front-end preamplifiers and the study of signal analysis techniques for the accurate estimation of the noise.

Erc Sector:

  • PE2_15
  • PE3_4

Keywords:

  • Semiconductor device noise
  • Circuit noise
  • Low-noise design
  • Noise estimation

Persone di riferimento