This activity is dedicated to the development of traceable noise measuring systems for the noise characterization of devices and materials, in particular for in the low-frequency regime.
This activity also includes the design of low-noise front-end preamplifiers and the study of signal analysis techniques for the accurate estimation of the noise.
- Semiconductor device noise
- Circuit noise
- Low-noise design
- Noise estimation
Persone di riferimento
- ORTOLANO MASSIMO - Responsabile