Modelling of devices for quantum metrology

This activity, in collaboration with INRIM, the Italian national metrology institute, is dedicated to the modelling of quantum Hall effect and single electron devices, which are commonly employed in the realization of quantum standards of resistance, impedance and current.   The purpose of these models is to allow the estimation of the measurement errors caused by the interconnections in complex measuring systems (e.g. quantum Hall effect impedance bridges) or in large device networks (e.g. quantum Hall array resistance standards).

ERC Sector:

  • PE7_3 Simulation engineering and modelling
  • PE7_5 (Micro and nano) electronic, optoelectronic and photonic components
  • PE2_17 Metrology and measurement

Keywords:

  • Hall effect
  • Single electron devices
  • Quantum Hall resistance standards

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