Microwave Characterization Laboratory (MiMiLab)

The lab deals with both linear and power characterization of high-frequency devices circuits and systems. On-wafer testing facilities and an active load-pull system are available thus allowing also for model-extraction oriented characterization of high frequency devices. Finally, system-level measurements with arbitrary modulated signals are also available for the characterization of wireless communication circuits.

Keywords: Microwave Measurements, Load Pull Measurements, High Frequency Characterization, On wafer Measurements

Contact e-mail: det.mimilab@polito.it

Position: Polito Maps

Research topics:

• DC characterization of hybrid and MMIC, active and passive devices and circuits
• Linear characterization of hybrid passive circuits
• Linear and non-linear characterization of hybrid active circuits
• Linear and non-linear on wafer characterization of MMIC devices and circuits
• Characterization oriented to active device model extraction

Available services:

• DC, linear and non-linear on wafer device characterization up to 26 GHz.
• Active and passive load and source -pull characterization up-to 20 GHz.
• System level characterization up to 20 GHz.
• Power amplifier characterization up to 40 GHz.