Pubblicazioni più recenti

Giampaolo, R. A. (2020)
Micrometric laser characterization of a 300μm fully-depleted monolithic active pixel sensor in standard 110 nm CMOS technology. Sta in: Innovative Particle and Radiation Detectors 2019 (IPRD19), pp. C06052-C06052. ISSN 1748-0221
Pancheri, Lucio; Giampaolo, Raffaele A.; Salvo, Andrea Di; Mattiazzo, Serena; Corradino, ... (2020)
Fully Depleted MAPS in 110-nm CMOS Process With 100–300-μm Active Substrate. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 67, pp. 2393-2399. ISSN 0018-9383 Download fulltext
Giampaolo, RAFFAELE AARON; Di Salvo, Andrea; Pancheri, Lucio; Croci, Tommaso; Olave, ... (2019)
Depleted MAPS on a 110 nm CMOS CIS Technology. Sta in: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 514-517. ISBN: 978-1-7281-0996-1 Download fulltext
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