Personale di altro ente/ditta esterna
Dipartimento Scienza Applicata e Tecnologia (DISAT)
Pubblicazioni
Pubblicazioni più recenti Vedi tutte le pubblicazioni su Porto@Iris
- Ribotta, Luigi (2022)
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy. relatore: ZUCCO, MASSIMO; , 34. XXXIV Ciclo, P.: 240
Doctoral Thesis - Bellotti, Roberto; Bartolo Picotto, Gian; Ribotta, Luigi (2022)
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes. In: NANOMANUFACTURING AND METROLOGY. ISSN 2520-8128
Contributo su Rivista - Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi (2022)
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy. In: ULTRAMICROSCOPY. ISSN 0304-3991
Contributo su Rivista - Ribotta, Luigi (2020)
Quarantena. In: Virus ex machina - Scritti meta-scientifici al tempo del Coronavirus / Vittorio Marchis, Marco Pozzi, S.L., Mimesis. ISBN: 9788857571966
Contributo in Volume - Maurino, Valter; Pellegrino, Francesco; Bartolo PICOTTO, Gian; Ribotta, Luigi (2020)
Atomic force microscopy metrology of non-spherical nanoparticles. In: 106° Congresso Nazionale Società Italiana di Fisica, 14-18 Settembre 2020. ISBN: 978-88-7438-123-4
Contributo in Atti di Convegno (Proceeding) - Ribotta, Luigi (2020)
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters.
Altro - Picotto, Gian Bartolo; Vallino, Marta; Ribotta, Luigi (2020)
Tip-sample characterization in the AFM study of a rod-shaped nanostructure. In: MEASUREMENT SCIENCE & TECHNOLOGY. ISSN 0957-0233
Contributo su Rivista - bartolo picotto, Gian; Ribotta, Luigi; Vallino, Marta (2019)
Tip-sample interactions in the AFM study of rod-shaped nanostructures. In: NanoScale 2019
Contributo in Atti di Convegno (Proceeding) - Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Bartolo Picotto, Gian; ... (2019)
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells. In: SURFACE TOPOGRAPHY. ISSN 2051-672X
Contributo su Rivista - Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi (2019)
Metrological characterization of nanoparticles by mAFM. In: 6th Nano Today Conference, 16-20 Giugno 2019
Contributo in Atti di Convegno (Proceeding) - Carofiglio, Marco; Damiani, Manuel; Giordano, Marco; Nguyen, Linh; Bartolo Picotto, ... (2019)
Tip-sample interaction in the AFM characterization of bio-plant nanostructures. In: 6th Nano Today Conference, 16-20 Giugno 2019
Contributo in Atti di Convegno (Proceeding) - Valentina, Furin; Gian Bartolo, Picotto; Ribotta, Luigi (2019)
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche. In: A&T - Automation & Testing - LA FIERA DEDICATA A INDUSTRIA 4.0, MISURE E PROVE, ROBOTICA, TECNOLOGIE INNOVATIVE
Contributo in Atti di Convegno (Proceeding) - Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi (2018)
AFM metrology of shape controlled TiO2 nanoparticles. In: NanoInnovation 2018 Conference&Exhibition
Contributo in Atti di Convegno (Proceeding) - Bellotti, Roberto; Maras, Claire; Bartolo Picotto, Gian; Pometto, Marco; Ribotta, Luigi (2018)
3D characterization of printed structures by stylus- and optical- based measurements. In: euspen - european society for precision engineering and nanotechnology, Venezia, 2018, pp. 493-494. ISBN: 978-0-9957751-2-1
Contributo in Atti di Convegno (Proceeding) - Bellotti, Roberto; Furin, Valentina; Maras, Claire; Bartolo Picotto, Gian; Ribotta, Luigi (2018)
A function-driven characterization of printed conductors on PV cells. In: SURFACE TOPOGRAPHY, vol. 6. ISSN 2051-672X
Contributo su Rivista - Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Bartolo Picotto, Gian; ... (2017)
Morphology-driven parameters of engineered functional surfaces. In: Macroscale - Recent Development in Traceable Dimensional Measurements, 17-19 October 2017
Contributo in Atti di Convegno (Proceeding)