Multiport RF and microwave characterization systems
The aim of the research activity is to develop knowledge and techniques for innovative multiport microwave and millimeter wave measurement systems.
The recent developments in telecommunication and computer technology increase the complexity of the devices, circuits and systems that are investigated in R&D labs at RF and microwave frequencies, therefore commercial measurement systems are now inadequate. Indeed, the complexity of the current techniques for linear characterization of multiport circuits becomes quickly unmanageable as the number of ports increases.
The main issues include: to reduce calibration and measurement time, the system cost, and to increase the accuracy, the on-wafer extension capabilities, and the flexibility (while guaranteeing best-in-class error correction accuracy).