Experimental characterization of integrated circuits performances in terms of electromagnetic compatibility

The interest in evaluating both integrated circuit (IC) conducted and radiated emissions as well as their immunity to radio frequency (RF) and transient interference has grown in recent years since the electromagnetic compatibility at IC level brings to a mitigation of system level emissions and it makes possible to improve the equipment immunity making needless expensive filter and shielding components.

In order to characterize ICs in terms of both radiated and conducted EME several measurement methods have been developed until now, some of them are international standards while others are up on the way of standardization.

This research activity is devoted to identify the electrical quantities that better provide a measure of the IC emission and immunity profile and the main research achievements will result in the design of innovative characterization with the aim to discuss them within standard committees of International Electrotechnical Commission (IEC).

Research groups

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