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Microelectronics Electromagnetic Compatibility Laboratory

The µEMC laboratory is equipped to perform the measurement of integrated circuit electromagnetic emission and susceptibility in accordance to the following international standards: IEC 61967 (Integrated circuits, Measurement of Electromagnetic Emissions, 150kHz - 1GHz) – TEM cell method (IEC 61967-2), surface scan method (IEC61967-3), 1/150 ohm method (IEC 61967-4), workbench faraday cage (IEC 61967-5), magnetic probe method (IEC 61967-6); IEC 62132 (Integrated Circuit, Measurement of Electromagnetic Immunity, 150kHz - 1GHz), TEM cell method (IEC 62132-2), bulk current injection method (IEC 62132-3), DPI method (IEC 62132-4), workbench faraday cage (IEC 62132-5). The µEMC laboratory is able to perform comparative valuation of IC EMC performances in accordance to the above mentioned international standards.