Efficiency and reliability of visible and UV light emitting diodes
We are developing models, both semiempirical and based on first-principles approaches, to understand the efficiency- and reliability-limiting mechanisms of visible and UV GaN-based LEDs. This activity involves ongoing cooperations with Università di Padova (Enrico Zanoni), Università di Modena e Reggio Emilia (Giovanni Verzellesi), Boston University (Enrico Bellotti), and is supported since 2012 by the U.S. Army Research Laboratory through the Collaborative Research Alliance (CRA) for MultiScale multidisciplinary Modeling of Electronic materials (MSME).
- PE7_3 Simulation engineering and modelling
- PE7_5 (Micro and nano) electronic, optoelectronic and photonic components
- Light emitting diodes
- Semiconductor device reliability
- Efficiency droop
- III-N compound semiconductors